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- Title
Pediyatrik Hastalarda Volümetrik (320 dedektörlü) ID Paranazal Tomografi: Düşük Doz ama Nereye Kadar?
- Authors
Koç, Gonca; Doğan, Mehmet Sait
- Abstract
Objective: In the vicinity of paranasal region, there are radiosensitive organs as thyroid gland and eye. The radiation dose exposed during paranasal computed tomography (CT) is particularly important in pediatric patients. We sought to answer the question of how much we could decrease the radiation dose during paranasal CT imaging in pediatric patients without decreasing diagnostic quality. Methods: Thirty patients (10 females, 20 males) referred for paranasal CT formed two patient groups. Patients were scanned with a 320-row-detector CT device (Aquilion ONE, Toshiba Medical Systems Corporation, Japan). The weight-adjusted standard imaging protocol (100-120 kV, 100-120 mAs) was applied for the first group, the low-dose parameters (100-120 kV, 25-30 mAs) were implemented to the second group. Remaining parameters were kept constant (rotation time: 0.5 s, collimation: 0.5x200-320) for both groups. Coronal reformatted images with 3 mm slice thickness were obtained and sent to picture archiving and computing system after excluding patient-dose information. Two pediatric radiologists evaluated the images independently for the diagnostic quality using a 5-scale scoring system. Results: The mean DLP values were 326±292 mGy*cm and 30.1±4.4 mGy*cm for the standard and low dose protocols, respectively. The effective dose was reduced by 72% in the low-dose protocol (0.6±0.2 mSv and 0.11±0.1 mSv, p<0.05). There was no significant difference of diagnostic quality in image sets (p>0.05). There was a good agreement between radiologists in the evaluation of images obtained using low, and standard doses (k=0.87). Conclusion: Paranasal sinus CT may be obtained at two Waters graphy dose without compromising diagnostic quality solely by reducing the tube current in pediatric patients.
- Publication
Journal of Dr. Behcet Uz Children's Hospital, 2019, Vol 9, Issue 2, p81
- ISSN
2146-2372
- Publication type
Academic Journal
- DOI
10.5222/buchd.2019.00378